a-axis YBa2Cu3O7−x/PrBa2Cu3O7−x/YBa2Cu3O7−x trilayers with subnanometer rms roughness
نویسندگان
چکیده
منابع مشابه
RMS slope of exponentially correlated surface roughness for radar applications
In radar signature analysis, the root mean square (RMS) surface slope is utilized to assess the relative contribution of multiple scattering effects. For an exponentially correlated surface, an effective RMS slope can be determined by truncating the high frequency tail of the roughness spectrum. The choice of the cutoff frequency and the effect on surface scattering simulations are discussed.
متن کاملRMS slope of exponentially correlated surface roughness for radar applications
In radar signature analysis, the root mean square (RMS) surface slope is utilized to assess the relative contribution of multiple scattering effects. For an exponentially correlated surface, an effective RMS slope can be determined by truncating the high frequency tail of the roughness spectrum. The choice of the cutoff frequency and the effect on surface scattering simulations are discussed.
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ژورنال
عنوان ژورنال: APL Materials
سال: 2021
ISSN: 2166-532X
DOI: 10.1063/5.0034648